
Numerical Simulation of Charge Damage during Oblique Penetration
BI Chao, GUO Xiang, QU Ke-peng, SHEN Fei
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ISSN 1007-7812
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Published By: Chinese Journal of Explosives & Propellants
CN 61-1310/TJ
Numerical Simulation of Charge Damage during Oblique Penetration
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