STM探针对被测表面作用力的测量
张海成;张健;张玉芬
Measurement of the Force Applied by a Scanning Tunneling Microscope Stylus on the Measured Surface
Zhang Haicheng;Zhang Jian;Zhang Yufen
兵工学报 . 1999, (2): 175 -178 .  DOI: 10.3969/j.issn.1000-1093.1999.02.019