YUAN Liang, YUAN Linguang, DONG Zaitian, LI Yan, FAN Jihong, LU Fei, ZHAO Juncheng, ZHANG Deng, YOU Yue
2023, 44(3): 33-39.
In order to meet the high-precision measurement requirement of spectral emissivity of high temperature material coating, including the stealthy materials, thermal protection materials, heat insulating coat and so on, the measuring methods for normal spectral emissivity of materials at 1 273 K~3 100 K was explored. A measurement model of normal spectral emissivity of materials was established firstly based on the emissivity definition. On this basis, the measurement facility of normal spectral emissivity of materials was built, the wavelength range is 0.7 μm to 14 μm. In order to overcome the technical difficulties of the cavity effect caused by heating the sample in the measuring device, a temperature sample furnace with a movable graphite crucible was developed, and good experimental results were obtained. The normal spectral emissivity of two samples (SiC and low emissivity coating) were measured by this facility. The results show that normal spectral emissivity of two samples decrease with wavelengths and increased with temperature. Finally, the measurement uncertainty of normal spectral emissivity of materials at high temperature was analyzed, the relative expanded uncertainty is 3.6%.