Measurement of optical path deflection and parallelism in binocular microscope system

XU Ku;HAN Sen;ZHANG Qi-yuan;XIE Xiang;ZHANG Zhong-hua;LIU Wen-bin;NIE Ying-hua;WU Quan-ying

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    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2014, Vol. 35 ›› Issue (3) : 452-458.

Measurement of optical path deflection and parallelism in binocular microscope system

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