MTF test technology analysis of infrared electro-optical imaging system

BIAN Jiang;MA Dong-mei;SUN Ge;SHAO Jing

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    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2013, Vol. 34 ›› Issue (5) : 748-753.

MTF test technology analysis of infrared electro-optical imaging system

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