Development of high-resolution X-ray image intensifier for inspection of circuit boards

CAO Xi-bin;ZHAO Bao-sheng;SAI Xiao-feng;WEI Yong-lin;LI Wei;ZHAO Fei-fei

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    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2008, Vol. 29 ›› Issue (6) : 900-904.

Development of high-resolution X-ray image intensifier for inspection of circuit boards

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