New method for displacement measurement in nanometer level using speckle interference and gray level

LI Lin-sen;HU Man-li;JIA Fang;HAO Jing-bo;LIN Qiao-wen;ZHOU Jing-hui

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    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2007, Vol. 28 ›› Issue (5) : 654-658.

New method for displacement measurement in nanometer level using speckle interference and gray level

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