Thickness measurement of thin film for holographic plate by Michelson interferometer

JIANG Li;LUO Shao-xuan;YANG Yan;YANG Ke-ling

  • Sponsored by:

    Editor-In-Chief:

    ISSN 1002-2082

     
  • Hosted By:

    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2006, Vol. 27 ›› Issue (3) : 250-253.

Thickness measurement of thin film for holographic plate by Michelson interferometer

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2006, 27(3): 250-253

References

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail

Sections
Recommended

/