Two-flat crystal three-sided mutual test technology based on N-position image rotation method

ZHANG Zhengyu;CHEN Lei;KONG Lu;WANG Yuntao;CHEN Jia;HU Chenhui;ZHENG Donghui

  • Sponsored by:

    Editor-In-Chief:

    ISSN 1002-2082

     
  • Hosted By:

    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2021, Vol. 42 ›› Issue (1) : 104-112. DOI: 10.5768/JAO202142.0103002

Two-flat crystal three-sided mutual test technology based on N-position image rotation method

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2021, 42(1): 104-112 https://doi.org/10.5768/JAO202142.0103002

References

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail

Sections
Recommended

/