Single test error analysis for integral sensitivity of low-light-level image intensifier

BAI Xiaofeng;CHENG Hongchang;HE Kaiyuan;HAN Kun;YANG Shuning;LI Junguo;CHEN Xulang;DANG Xiaogang;WANG Lei

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    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2020, Vol. 41 ›› Issue (4) : 791-795. DOI: 10.5768/JAO202041.0404001

Single test error analysis for integral sensitivity of low-light-level image intensifier

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2020, 41(4): 791-795 https://doi.org/10.5768/JAO202041.0404001

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