Review of microsphere optical microscopy for super-resolution imaging and metrology

XU Wei;YUAN Qun;GAO Zhishan;YU Haobiao;SUN Yifeng;QU Yi

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    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2019, Vol. 40 ›› Issue (6) : 1139-1151. DOI: 10.5768/JAO201940.0605002

Review of microsphere optical microscopy for super-resolution imaging and metrology

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2019, 40(6): 1139-1151 https://doi.org/10.5768/JAO201940.0605002

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