Reliability of Ge-based MW antireflective films in hygrothermal environment

Chen Fen-gjin;Su Xian-jun;Ma Sheng-xi;Sun Yong-yan;Yan Kai

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    Published By: Journal of Applied Optics

    CN 61-1171/O4

Journal of Applied Optics ›› 2015, Vol. 36 ›› Issue (1) : 93-97. DOI: 10.5768/JAO201536.0105001

Reliability of Ge-based MW antireflective films in hygrothermal environment

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2015, 36(1): 93-97 https://doi.org/10.5768/JAO201536.0105001

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