一种基于PIN型光电二极管频率响应的测试方法

管敏杰;赵冬娥

应用光学 ›› 2012, Vol. 33 ›› Issue (6) : 1088-1091.

应用光学 ›› 2012, Vol. 33 ›› Issue (6) : 1088-1091.

一种基于PIN型光电二极管频率响应的测试方法

  • 管敏杰,赵冬娥
作者信息 +

Test method of frequency response based on PIN photoelectric diode

  • GUAN Min-jie,ZHAO Dong-e
Author information +
文章历史 +

摘要

根据信号系统相关理论,提出了一种针对该类光电探测器频率响应的测试方法。该方法实现的测试系统主要包括窄带脉冲激光光源、光强衰减装置和光电探测器等。由光电探测器接收经过光强衰减后的窄带激光脉冲信号,同时利用数字示波器获得相应信号波形的上升时间;根据相关的计算公式,得到光电探测器的频率响应;对所得测试结果进行误差分析。实验结果表明:对理论频率响应带宽为10.6 MHz的探测器,利用该方法测得的相对误差为6%左右, 该测试方法简单、可行,适用范围广。

Abstract

According to the relevant theory of the signals and systems, a test method for frequency response of the PIN photoelectric diode detector was proposed. The test system realized by the method includes the light source of the narrowband pulse laser, the attenuation device of the light intensity and the photoelectric detector, etc. Firstly, the photoelectric detector received the signal of the narrowband pulse laser which went through the attenuation device, meanwhile, the rise time of the corresponding signal waveform was obtained by the digital oscilloscope. Then, according to the relevant calculation formula, the frequency response of the photoelectric detector was got. Finally, the error of test results was analyzed. The experimental result shows that the relative error by this method is about 6% of the detector whose theoretical frequency response bandwidth is 10.6MHz, and the test method is simple,feasible and applied widely.

关键词

频率响应 / 光电二极管 / 上升时间 / 光电探测

Key words

photoelectric detection / photoelectric diode / frequency response / rise time

引用本文

导出引用
管敏杰, 赵冬娥. 一种基于PIN型光电二极管频率响应的测试方法. 应用光学. 2012, 33(6): 1088-1091
GUAN Min-jie, ZHAO Dong-e. Test method of frequency response based on PIN photoelectric diode. Journal of Applied Optics. 2012, 33(6): 1088-1091

参考文献

[1]徐立君,蔡红星,李昌立,等.强激光辐照下光电探测器响应性能的研究[J].应用光学,2010,31(6): 1018-1022.
XU Li-jun, CAI Hong-xing, LI Chang-li, et al. Responsivity of photoelectric detector irradiated by intense laser[J]. Journal of  Applied  Optics, 2010,31 (6):1018-1022. (in Chinese with an English abstract)
[2]浦昭邦,赵辉.光电测试技术[M].北京:机械工业出版社,2009.
PU Zhao-bang, ZHAO Hui. Photoelectric test technolog

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