Electronic Equipment Fault Predicting Method Based on Accelerated Stress Lifetime Test

MA Yan-heng;HAN Jiu-qiang;LI Gang

Acta Armamentarii ›› 2008, Vol. 29 ›› Issue (7) : 834-838. DOI: 10.3969/j.issn.1000-1093.2008.07.012
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Electronic Equipment Fault Predicting Method Based on Accelerated Stress Lifetime Test

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